project-chip
[Bug] TC-CADMIN-1.6 consistently failed during clean up.
From chip-certification-tool created by yinyihu-silabs: CHIP-Specifications/chip-certification-tool#995
Describe the bug
While running TC-CADMIN-1.6, after Step 12, during unpairing chip_tool_from device, test ran into error
INFO | 2023-10-19 17:37:34.887718 | Executing Test Step: Step 12: TH_CR2 starts a commissioning process on DUT_CE
INFO | 2023-10-19 17:38:05.169099 | Test Step Completed [PASSED]: Step 12: TH_CR2 starts a commissioning process on DUT_CE
INFO | 2023-10-19 17:38:05.179263 | Executing Test Step: DUT_CE is commissioned by TH_CR2
INFO | 2023-10-19 17:38:05.184443 | Test Step Completed [PASSED]: DUT_CE is commissioned by TH_CR2
INFO | 2023-10-19 17:38:05.191108 | Test Case Completed[PENDING]: TC-CADMIN-1.6 (Semi-automated)
INFO | 2023-10-19 17:38:05.198615 | Unpairing chip_tool from device
ERROR | 2023-10-19 17:38:15.587297 | Test Suite Error: Error occurred during cleanup of test suite FirstChipToolSuite. Connecting to ws://172.18.0.1:9002 failed.
INFO | 2023-10-19 17:38:15.602690 | Test Suite Completed [ERROR]: FirstChipToolSuite
INFO | 2023-10-19 17:38:15.616839 | Test Run Completed [ERROR]
Other cadmin tests such as 1.10, 1.16, 1.23 do not experience the same issue
Steps to reproduce the behavior
No response
Expected behavior
No response
Log files
cadmin-1-6_2023_10_19_13_32_32.log
PICS file
No response
Screenshots
Environment
Additional Information
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@ccruzagralopes same?
No, this is something else. The other issues were specifically related to simulated tests.
It seems the timeout defined in YAML file for this test case its not enough (300). @manjunath-grl , maybe the timeout should be increase in YAML test script? Another solution, the user may include the timeout in project configuration as bellow:
"test_parameters": {
"timeout": 600
}
The originator(yinyihu-silabs) from the bug in the previous repo is not listed here.