MooZ

Tests

1

Add tests to validate address computation. Maybe do this in the form of a set of unit tests.

Write a proper README and fill the wiki with examples.

Add return values so that we can check for invalid arguments (for example when the chip has only one buffer). See #17

Find what are the differences between the D and the new E serie. [AT45DB161E datasheet](http://www.adestotech.com/data/doc8782.pdf)

Methods to be tested: - deepPowerDown - resumeFromDeepPowerDown

As chip erase seems to be buggy, there are suspicions that sector erase may be buggy as well.

Check that the alternative chip erase implementation. [ref](http://blockos.github.com/arduino-dataflash/doxygen/html/group___a_t45___c_h_i_p___e_r_a_s_e___e_n_a_b_l_e_d.html)

Get rid of platform

2

Use third party libraries if needed.

Add an option to specify sector type. - [x] cli option - [x] cd sector read